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Reverse Engineering Software | Metrolog X4

Supplier: Industrial Measurement Solutions

High end metrology software for advanced inspection of manufactured parts.


  • Probing Inspection against CAD models
  • Point cloud comparison to CAD
  • Advanced programming functionality for routine inspection
  • Advanced GD&T analysis (ISO and ANSI)
  • Compatible with all major portable measurement devices and CMM

High performances: large data set (CAD, point clouds)

For increased performance and process reliability

Metrolog X4's 64-bit architecture increases the amount of available memory. This improves performance, especially when inspecting large volumes. The new architecture furthermore provides full support for multi-core processors.

The new software architecture brings two main advantages:

  • The ability to increase the file size handling significantly for:
    • CAD files import and manipulation
    • Point cloud import or acquisition
  • The ability to significantly reduce conversion and projection time while using large data sets (CAD files, Point clouds…).
    • Native 64-bit application, multi-core and multi-task enabled: Metrolog X4 is ready for the future.

Compatibility connectivity: all devices supported

  • Compatible with all portable devices
  • Arms, laser trackers and P.O.D. systems
  • All brands supported
  • Multi-connection
  • On the fly switching between measuring devices

Optimal interface: ease of use

  • User-friendly graphical interface and fully customisable to suit the needs of the operator, the machine types and measurement types
  • New manual probing wizard
  • Automatic view orientation during acquisition
  • Multiple information windows (position and results)
  • Software readily available in 18 languages, switchable on the fly

Dynamicity: automatic update re-computation

  • Dynamic links between the features
  • Real-time impact on features upon update
  • Large scale scenario supported: Bundle
  • Optimisation taking 7 degrees of freedom into account
  • Consideration of device uncertainty (instruments network)

Enhanced analysis: best in class GD&T and reporting

  • All GD&T tolerances supported: ANSI and ISO
  • Set easily geometrical tolerance
  • New GD&T engine: enhanced performances
  • Best in class reporting tools
  • Report editor, customise any type of output: Wizard, report editor, direct export library
  • Certified and well-known solution
  • Certified algorithms by PTB and NIST
  • Signed agreement with major actors in 3D inspection and PLM suppliers

Maximum performance in the point clouds analysis

Metrolog X4 designed to process and analyse the largest and most dense point clouds.

Metrolog X4 integrates the latest technology required for efficient optical measurement functions, ensuring that you have the best tool whatever the device used.

  • Cloud comparison with CAD (Colour Mapping)
  • Element extraction and automated GD&T
  • Intuitive treatment of Flush and Gap
  • Measurement with compensation for material thickness
  • Part quality estimation according to the surface mm² (area calculation)

Click here to view the Metrolog X4 product brochure