An important consideration in developing your boundary-scan applications is optimizing the testability and programming performance. Make sure you refer to our informative DFT booklets where you'll find valuable tips on getting the most from this technology.
One of the most effective ways to increase test coverage is through the use of DIMM modules. We offer a wide range of DIMM modules, so there is sure to be one that meets your needs. The modules serve as additional boundary-scan resources giving you test access in areas of your board or system that were previously inaccessible. For example, use DIMMs to test through board-edge connectors or to reach into non-scan clusters on your board. The coverage feature of JTAG ProVision will show you the improvement in testability that you've achieved.
There are two types of DIMMs, general-purpose Digital Input/Output Scan (DIOS) modules and Socket Test Modules (STM). DIOS modules plug into standard 168-pin DIMM sockets and operate over a range of voltages and TCK rates, up to 45 MHz. Programmable functionality is a feature of some of the DIOS modules, enabling them to be used to enhance functional testing.
Typical application of the STMs is to test connector sockets within the target system. STMs are offered with pinouts from 100 to 300 pins, including several small-outline pinouts.