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Bit Error Rate Tester AQ2200-601

Supplier: Yokogawa

The AQ2200-601 is a Compact bit error rate tester dedicated to high-speed 10 Gbit/s Band.

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It offers high quality features such as built-in internal Signal Generator (SG) and Clock Data Recovery (CDR), EO/OE interfaces, and several variable signal output functions.

The AQ2200 series MultiApplication Test System is designed for universal purposes; therefore various modules for various applications can be accommodated. (i.e. Optical Power Meter, Light Source and Optical Attenuator modules).

Features & Benefits of Bit Error Rate Tester AQ2200-601:

  • PPG, ED and SG integrated design
  • Handles multiple bit rates (9.95 Gbit/s to 11.32 Gbit/s)
  • Adjust output amplitude, offset and crosspoint
  • Clock and Data Recovery (CDR) function included
  • Compact and lightweight
  • Combine with other optical modules to create a variety of tests
  • Combine with an optical modulator, receiver, and attenuator to measure error rate curves
  • 64 Mbit long program pattern generation capability
  • Output level range: 0.5 to 2.0 Vp-p
  • Offset range: -2.0 V to +3.0 V
  • Cross-point adjustment range: 30 to 70%
  • Input threshold level adjustment
  • Optical modulator and receiver (Optional)

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