Advanced programming functionality for routine inspection
Advanced GD&T analysis (ISO and ANSI)
Compatible with all major portable measurement devices and CMM
High performances: large data set (CAD, point clouds)
For increased performance and process reliability
Metrolog X4's 64-bit architecture increases the amount of available memory. This improves performance, especially when inspecting large volumes. The new architecture furthermore provides full support for multi-core processors.
The new software architecture brings two main advantages:
The ability to increase the file size handling significantly for:
CAD files import and manipulation
Point cloud import or acquisition
The ability to significantly reduce conversion and projection time while using large data sets (CAD files, Point clouds…).
Native 64-bit application, multi-core and multi-task enabled: Metrolog X4 is ready for the future.
Compatibility connectivity: all devices supported
Compatible with all portable devices
Arms, laser trackers and P.O.D. systems
All brands supported
On the fly switching between measuring devices
Optimal interface: ease of use
User-friendly graphical interface and fully customisable to suit the needs of the operator, the machine types and measurement types
New manual probing wizard
Automatic view orientation during acquisition
Multiple information windows (position and results)
Software readily available in 18 languages, switchable on the fly
Dynamicity: automatic update re-computation
Dynamic links between the features
Real-time impact on features upon update
Large scale scenario supported: Bundle
Optimisation taking 7 degrees of freedom into account
Consideration of device uncertainty (instruments network)
Enhanced analysis: best in class GD&T and reporting
All GD&T tolerances supported: ANSI and ISO
Set easily geometrical tolerance
New GD&T engine: enhanced performances
Best in class reporting tools
Report editor, customise any type of output: Wizard, report editor, direct export library
Certified and well-known solution
Certified algorithms by PTB and NIST
Signed agreement with major actors in 3D inspection and PLM suppliers
Maximum performance in the point clouds analysis
Metrolog X4 designed to process and analyse the largest and most dense point clouds.
Metrolog X4 integrates the latest technology required for efficient optical measurement functions, ensuring that you have the best tool whatever the device used.
Cloud comparison with CAD (Colour Mapping)
Element extraction and automated GD&T
Intuitive treatment of Flush and Gap
Measurement with compensation for material thickness
Part quality estimation according to the surface mm² (area calculation)
Click here to view the Metrolog X4 product brochure
IMS specialises in the supply, training and support of measuring systems in 3 main areas: 3D Measurement in Industry, GPS systems and metrology.
IMS have Metrology Systems suitable for measurements ...