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X-Ray Fluorescence Analasys/Thickness Gauges XRF XDL

Supplier: KK and S Instruments

The XRF XDL defines nondestructive and contact free measurement of thickness and alloy composition of virtually any metallic coatings on any substrate material as well as material and solution analysis using the X-Ray fluorescence method.

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X-Ray Fluorescence Analasys/Thickness Gauges XRF XDL

Five instrument models which differ in measuring table and X-Ray head design are available:

  • Fixed test piece support plate with removable insert and fixed position X-Ray head
  • Manual X-Y stage and fixed position X-Ray head
  • Manual X-Y stage and motorized Z-axis travel X-Ray head
  • Programmable X-Ystage and fixed position X-Ray head
  • Programmable X-Y stage and programmable X-Ray head Z-axis travel

The XDL® features a unique method for distance correction of measurements. This DCM method (Distance Controlled Measurement) corrects automatically the intensity differences of fluorescence spectra at different measurement distances.

Using a XDL® with fixed position X-Ray head this feature offers the possibility for simple measurements on test pieces with complex geometry and different measuring areas distances.

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