J A Woollam Ellipsometer | VUV-VASE
J A Woollam - Ellipsometer | VUV-VASE
Supplier: Scientific Solutions
Ellipsometer | VUV-VASE
The VUV-VASE® variable angle spectroscopic ellipsometer is the gold standard for optical characterization of lithography thin films.
Description
In Stock
Specifications of this product
- Ellipsometer Configuration RAE with AutoRetarder
- Wavelength Range VUV-VASE (Standard)
- VUV-VASE+NIR
- VUV-VASE+XNIR 146-1100 nm
- 146-1700 nm
- 146-2500 nm
- Number of Wavelengths User defined before measurement
- Angles of Incidence 10° to 90° (146nm to 310nm)
- 25° to 90° (310nm to 2500nm)
- Data Acquisition Rate 1 to 3 seconds per wavelength
To contact Scientific Solutions about J A Woollam Ellipsometer | VUV-VASE use Get a quote.
Specifications of this product
- Ellipsometer Configuration RAE with AutoRetarder
- Wavelength Range VUV-VASE (Standard)
- VUV-VASE+NIR
- VUV-VASE+XNIR 146-1100 nm
- 146-1700 nm
- 146-2500 nm
- Number of Wavelengths User defined before measurement
- Angles of Incidence 10° to 90° (146nm to 310nm)
- 25° to 90° (310nm to 2500nm)
- Data Acquisition Rate 1 to 3 seconds per wavelength
To contact Scientific Solutions about J A Woollam Ellipsometer | VUV-VASE use Get a quote.
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Supplier
Supplier: Scientific Solutions
Location: Menai , NSW
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