X-Ray Fluorescence Analysis/Thickness ...
X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL
The XRF XDL defines nondestructive and contact free measurement of thickness and alloy composition of virtually any metallic coatings on any substrate material as well as material and solution analysis using the X-Ray fluorescence method.
X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL
Five instrument models which differ in measuring table and X-Ray head design are available:
- Fixed test piece support plate with removable insert and fixed position X-Ray head
- Manual X-Y stage and fixed position X-Ray head
- Manual X-Y stage and motorized Z-axis travel X-Ray head
- Programmable X-Ystage and fixed position X-Ray head
- Programmable X-Y stage and programmable X-Ray head Z-axis travel
The XDL® features a unique method for distance correction of measurements. This DCM method (Distance Controlled Measurement) corrects automatically the intensity differences of fluorescence spectra at different measurement distances.
Using a XDL® with fixed position X-Ray head this feature offers the possibility for simple measurements on test pieces with complex geometry and different measuring areas distances.
To contact KK and S Instruments about X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL use Get a quote.
X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL
Five instrument models which differ in measuring table and X-Ray head design are available:
- Fixed test piece support plate with removable insert and fixed position X-Ray head
- Manual X-Y stage and fixed position X-Ray head
- Manual X-Y stage and motorized Z-axis travel X-Ray head
- Programmable X-Ystage and fixed position X-Ray head
- Programmable X-Y stage and programmable X-Ray head Z-axis travel
The XDL® features a unique method for distance correction of measurements. This DCM method (Distance Controlled Measurement) corrects automatically the intensity differences of fluorescence spectra at different measurement distances.
Using a XDL® with fixed position X-Ray head this feature offers the possibility for simple measurements on test pieces with complex geometry and different measuring areas distances.
To contact KK and S Instruments about X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL use Get a quote.
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