X-Ray Fluorescence Analysis/Thickness ...

Get Callback
Call

X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL

Supplier: KK and S Instruments
People also viewed: Thickness Gauge & Sensor

The XRF XDL defines nondestructive and contact free measurement of thickness and alloy composition of virtually any metallic coatings on any substrate material as well as material and solution analysis using the X-Ray fluorescence method.

Item Specifics
Contact supplier for price
Delivery Australia Wide
Availability: Call for more details
Supplier Details
02 8850-37..
SOUTH WINDSOR NSW
For more information contact the supplier. If calling, say you found them on IndustrySearch so they can best assist you.

Need more information? Message KK and S Instruments via the form, or call and say you found them on IndustrySearch so they can best assist you.

Report this product