X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL

X-Ray Fluorescence Analysis/Thickness Gauges XRF XDL

Five instrument models which differ in measuring table and X-Ray head design are available:

• Fixed test piece support plate with removable insert and fixed position X-Ray head
  
• Manual X-Y stage and fixed position X-Ray head
  
• Manual X-Y stage and motorized Z-axis travel X-Ray head
  
• Programmable X-Ystage and fixed position X-Ray head
  
• Programmable X-Y stage and programmable X-Ray head Z-axis travel
  

The XDL® features a unique method for distance correction of measurements. This DCM method (Distance Controlled Measurement) corrects automatically the intensity differences of fluorescence spectra at different measurement distances.

Using a XDL® with fixed position X-Ray head this feature offers the possibility for simple measurements on test pieces with complex geometry and different measuring areas distances.