High-Precision X-Ray Diffractometer | ...
High-Precision X-Ray Diffractometer | Explorer Theta/Theta XRD
Explorer is a multipurpose Theta/Theta high resolution diffractometer.
High-resolution Theta/Theta diffractometer with direct-drive torque motors. Designed for advanced phase and microstructural analysis on bulk and thin films. Supports XPD, XRR, GIXRD, HRXRD, TXRF, residual stress, and texture studies. Modular, upgradeable, and adaptable to future needs.
Key Features
- Modular system with 400/500/600 mm circle diameters
- Quick component exchange without realignment
- Glass or ceramic tubes, parabolic mirror optics
- Rotating line/point focus shield
- Adjustable slits: mechanical or motorized
- Multiple spinners and sample holders
- Support for SAXS, HRXRD, XRR, GID
- Compatible with scintillation, SDD, 1D/2D detectors
- CeleriX 0D/tilted detector, high-speed texture analysis
- Eulerian cradle and XYZ piezo stage
Technical Overview
- X-ray generator: 3 kW (opt. 4 kW), 60 kV, 60 mA
- Stability: <0.01%, ripple: 0.03% rms
- X-ray tube: Cu anode, 0.4×8 mm, 3 kW
- Goniometer: horizontal/vertical Theta/2Theta
- Angular range: -110° to +168°, step size: 0.0001°
- Scan modes: continuous, step, fast, oscillation
- Slits: divergence, anti-divergence, receiver, Soller
- Detector: NaI (opt. YAP(Ce), multistrip), 2×106 cps
- Case: 1400×1800×850 mm, X-ray leakage <1 mSv/year
- Processing: PC-controlled, handles full system
- Data output: phase, Rietveld, strain, crystallinity
Software
- Supports high-res and powder diffraction
- Stress, texture, thin film, and SAXS acquisition
- Peak analysis, smoothing, subtraction, deconvolution
- Crystallite size, lattice strain, reflectometry
- Search/Match (MATCH!), Rietveld refinement
- Multiphase display, background control, auto batch
Applications
- Crystalline phase ID and quantification
- Crystallinity, lattice strain, polymorph screening
- Residual stress and retained austenite
- Thin film and multilayer depth profiling
- Phase transitions, preferred orientation, texture
- High-res reflectometry for layer thickness, roughness, and density analysis
To contact Radiant Instruments Pty Ltd about High-Precision X-Ray Diffractometer | Explorer Theta/Theta XRD use Get a quote.
High-resolution Theta/Theta diffractometer with direct-drive torque motors. Designed for advanced phase and microstructural analysis on bulk and thin films. Supports XPD, XRR, GIXRD, HRXRD, TXRF, residual stress, and texture studies. Modular, upgradeable, and adaptable to future needs.
Key Features
- Modular system with 400/500/600 mm circle diameters
- Quick component exchange without realignment
- Glass or ceramic tubes, parabolic mirror optics
- Rotating line/point focus shield
- Adjustable slits: mechanical or motorized
- Multiple spinners and sample holders
- Support for SAXS, HRXRD, XRR, GID
- Compatible with scintillation, SDD, 1D/2D detectors
- CeleriX 0D/tilted detector, high-speed texture analysis
- Eulerian cradle and XYZ piezo stage
Technical Overview
- X-ray generator: 3 kW (opt. 4 kW), 60 kV, 60 mA
- Stability: <0.01%, ripple: 0.03% rms
- X-ray tube: Cu anode, 0.4×8 mm, 3 kW
- Goniometer: horizontal/vertical Theta/2Theta
- Angular range: -110° to +168°, step size: 0.0001°
- Scan modes: continuous, step, fast, oscillation
- Slits: divergence, anti-divergence, receiver, Soller
- Detector: NaI (opt. YAP(Ce), multistrip), 2×106 cps
- Case: 1400×1800×850 mm, X-ray leakage <1 mSv/year
- Processing: PC-controlled, handles full system
- Data output: phase, Rietveld, strain, crystallinity
Software
- Supports high-res and powder diffraction
- Stress, texture, thin film, and SAXS acquisition
- Peak analysis, smoothing, subtraction, deconvolution
- Crystallite size, lattice strain, reflectometry
- Search/Match (MATCH!), Rietveld refinement
- Multiphase display, background control, auto batch
Applications
- Crystalline phase ID and quantification
- Crystallinity, lattice strain, polymorph screening
- Residual stress and retained austenite
- Thin film and multilayer depth profiling
- Phase transitions, preferred orientation, texture
- High-res reflectometry for layer thickness, roughness, and density analysis
To contact Radiant Instruments Pty Ltd about High-Precision X-Ray Diffractometer | Explorer Theta/Theta XRD use Get a quote.
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- Zimbabwe
- NSW
- VIC
- QLD
- SA
- WA
- NT
- ACT
- TAS
- New Zealand
- Papua New Guinea
- Afghanistan
- Albania
- Algeria
- Andorra
- Angola
- Antigua and Barbuda
- Argentina
- Armenia
- Austria
- Azerbaijan
- Bahamas
- Bahrain
- Bangladesh
- Barbados
- Belarus
- Belgium
- Belize
- Benin
- Bhutan
- Bolivia
- Bosnia and Herzegovina
- Botswana
- Brazil
- Brunei
- Bulgaria
- Burkina Faso
- Burma
- Burundi
- Cabo Verde
- Cambodia
- Cameroon
- Canada
- Central African Republic
- Chad
- Chile
- China
- Colombia
- Comoros
- Congo (Brazzaville)
- Congo (Kinshasa)
- Costa Rica
- Côte d'Ivoire
- Croatia
- Cuba
- Cyprus
- Czechia
- Denmark
- Djibouti
- Dominica
- Dominican Republic
- Ecuador
- Egypt
- El Salvador
- Equatorial Guinea
- Eritrea
- Estonia
- Ethiopia
- Fiji
- Finland
- France
- Gabon
- Gambia
- Georgia
- Germany
- Ghana
- Greece
- Grenada
- Guatemala
- Guinea
- Guinea-Bissau
- Guyana
- Haiti
- Holy See
- Honduras
- Hungary
- Iceland
- India
- Indonesia
- Iran
- Iraq
- Ireland
- Israel
- Italy
- Jamaica
- Japan
- Jordan
- Kazakhstan
- Kenya
- Kiribati
- Korea, North
- Korea, South
- Kosovo
- Kuwait
- Kyrgyzstan
- Laos
- Latvia
- Lebanon
- Lesotho
- Liberia
- Libya
- Liechtenstein
- Lithuania
- Luxembourg
- Macedonia
- Madagascar
- Malawi
- Malaysia
- Maldives
- Mali
- Malta
- Marshall Islands
- Mauritania
- Mauritius
- Mexico
- Federated States of Micronesia
- Moldova
- Monaco
- Mongolia
- Montenegro
- Morocco
- Mozambique
- Namibia
- Nauru
- Nepal
- Netherlands
- New Zealand
- Nicaragua
- Niger
- Nigeria
- Norway
- Oman
- Pakistan
- Palau
- Panama
- Papua New Guinea
- Paraguay
- Peru
- Philippines
- Poland
- Portugal
- Qatar
- Romania
- Russia
- Rwanda
- Saint Kitts and Nevis
- Saint Lucia
- Saint Vincent and the Grenadines
- Samoa
- San Marino
- Sao Tome and Principe
- Saudi Arabia
- Senegal
- Serbia
- Seychelles
- Sierra Leone
- Singapore
- Slovakia
- Slovenia
- Solomon Islands
- Somalia
- South Africa
- South Sudan
- Spain
- Sri Lanka
- Sudan
- Suriname
- Swaziland
- Sweden
- Switzerland
- Syria
- Taiwan
- Tajikistan
- Tanzania
- Thailand
- Timor-Leste
- Togo
- Tonga
- Trinidad and Tobago
- Tunisia
- Turkey
- Turkmenistan
- Tuvalu
- Uganda
- Ukraine
- United Arab Emirates
- United Kingdom
- United States
- Uruguay
- Uzbekistan
- Vanuatu
- Venezuela
- Vietnam
- Yemen
- Zambia
- Zimbabwe
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