Xavis Semiconductor X-ray Inspection | ...

Xavis - Semiconductor X-ray Inspection | TXM-XUi Research CT and Imaging

Supplier: ProfTek Pty Ltd

Semiconductor X-ray Inspection | TXM-XUi Research CT and Imaging

The XAVIS TXM-XUi is a liquid-metal-jet multi-CT system for research applications, with an energy of 9 keV and optional three-dimensional fluorescence mapping.

Liquid-metal-jet multi-CT system

Specifications

Specification	Value
Brand	XAVIS
Model	TXM-XUi
System type	liquid-metal-jet multi-CT system
Energy	9 keV

Features and research applications

Three-dimensional fluorescence mapping is optional and must be specified separately where required.
Research applications include battery, semiconductor, biological and nanoscale research.
Application examples do not establish a guaranteed result for an individual specimen.

Configuration considerations

Select the configuration according to specimen material and preparation, imaging objective and required data.
Confirm the intended configuration’s specifications, including imaging mode and any optional fluorescence-mapping capability.
Confirm resolution and field of view for the proposed imaging arrangement.
Define the region of interest, specimen dimensions and information required from reconstructed data.
Consider specimen preparation and handling constraints, the intended analysis workflow and evaluation criteria when comparing configurations or interpreting demonstration images.

To contact ProfTek Pty Ltd about Xavis Semiconductor X-ray Inspection | TXM-XUi Research CT and Imaging use Get a quote.

Specifications

Specification	Value
Brand	XAVIS
Model	TXM-XUi
System type	liquid-metal-jet multi-CT system
Energy	9 keV

Features and research applications

Three-dimensional fluorescence mapping is optional and must be specified separately where required.
Research applications include battery, semiconductor, biological and nanoscale research.
Application examples do not establish a guaranteed result for an individual specimen.

Configuration considerations

Select the configuration according to specimen material and preparation, imaging objective and required data.
Confirm the intended configuration’s specifications, including imaging mode and any optional fluorescence-mapping capability.
Confirm resolution and field of view for the proposed imaging arrangement.
Define the region of interest, specimen dimensions and information required from reconstructed data.
Consider specimen preparation and handling constraints, the intended analysis workflow and evaluation criteria when comparing configurations or interpreting demonstration images.

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To contact ProfTek Pty Ltd about Xavis Semiconductor X-ray Inspection | TXM-XUi Research CT and Imaging use Get a quote.

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Supplier

Supplier: ProfTek Pty Ltd

Location: Pagewood, NSW

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Pagewood , NSW

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Oct 2026

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