Helmut Fischer - FISCHERSCOPE X-RAY XDV XRF series Instruments

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Applications for this product

• Measurements on very small flat components and structures such as printed circuit boards, contacts or lead frames
• Measurement of functional coatings in the electronics and semiconductor industry
• Determination of complex multi-coating systems
• Automated measurements, e. g. in quality control
• Measurement of light elements, e. g. determination of the phosphorus content (in ENIG/ENEPIG) under gold and palladium

Features of this product

• Powerful premium model for precise coating thickness measurement and material analysis on smallest structures and thinnest coatings < 0.1 µm
• Microfocus tube with tungsten anode; molybdenum anode optional
• 4-fold changeable filter
• Extremely powerful silicon drift detector with 20 mm² or 50 mm² area for highest precision on thin films
• In-house manufactured polycapillary optics for smallest measuring points down to 10 μm FWHM, at short measuring times with high intensity
• Digital pulse processor DPP+ for higher count rates, reduced measuring times or better repeatability of your measurement results
• Analysis of elements from Al(13) to U(92), helium purge available, simultaneous measurement of up to 24 elements
• High precision, programmable XY stage with positioning accuracy of < 5 µm for most accurate sample positioning and automatic pattern recognition, for best repeatability precision

Why Choose This Product

• High precision layer thickness measurement
• Elemental analysis on the tiniest of structures
• The combination of polycapillary and digital pulse processor DPP+ delivers outstanding measurement results and ensures high count rates and even better standard deviations or shorter measurement times
• Various filters as well as voltage and current settings allow the best excitation conditions for complex applications with up to 24 elements

Specifications of this product

• Polycapillary: 20 µm halo (10 µm or 20μm halo free optional)
• Detector: 20 mm² SDD (50 mm² optional)
• X-ray tube: Microfocus tube with tungsten anode (molybdenum anode optional)
• Smallest measuring spot: 20 µm / 10 µm
• Measuring distance: fixed, appr . 4 … 5 mm / fixed, appr . 1.2 … 2 mm
• Max. sample height: 135 mm
• Usable sample placement area: 370 x 320 mm (620 x 530 mm optional)
• Max. travel XY axis: 250 x 220 mm
• X-ray standards: DIN ISO 3497, ASTM B 568, IPC-4552-A/B, IPC-4556

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To contact Lastek about Helmut Fischer FISCHERSCOPE X-RAY XDV XRF series Instruments use Get a quote.